Přihlásit seRegistrovat se
Jazyk czen
Menu
KontaktOBCHODNÁPOVĚDAE-ReadingNovinky
Hledání
0
Celková cena
0 Kč
Cena s DPH / bez DPH
Hlavní stránka>23/30454366 DC BS EN IEC 62047-45. Semiconductor devices. Micro-electromechanical devices Part 45. Silicon based MEMS fabrication technology. Measurement method of impact resistance of nanostructures
Sponsored link
sklademVydáno: 2023-04-20
23/30454366 DC BS EN IEC 62047-45. Semiconductor devices. Micro-electromechanical devices Part 45. Silicon based MEMS fabrication technology. Measurement method of impact resistance of nanostructures

23/30454366 DC

BS EN IEC 62047-45. Semiconductor devices. Micro-electromechanical devices Part 45. Silicon based MEMS fabrication technology. Measurement method of impact resistance of nanostructures

Formát
Dostupnost
Cena a měna
Anglicky Zabezpečené PDF
K okamžitému stažení
620 Kč
Anglicky Tisk
Skladem
620 Kč
Označení normy:23/30454366 DC
Počet stran:15
Vydáno:2023-04-20
Status:Draft for Comment
Popis

23/30454366 DC


This standard 23/30454366 DC BS EN IEC 62047-45. Semiconductor devices. Micro-electromechanical devices is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices

Tisk