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sklademVydáno: 2024-01-15
24/30465997 DC
Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
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600 Kč
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600 Kč
| Označení normy: | 24/30465997 DC |
| Počet stran: | 34 |
| Vydáno: | 2024-01-15 |
| Status: | Draft for Comment |
Popis
24/30465997 DC
This standard 24/30465997 DC Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary is classified in these ICS categories:
- 01.040.37 Image technology (Vocabularies)
- 01.040.71 Chemical technology (Vocabularies)
- 71.040.50 Physicochemical methods of analysis