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sklademVydáno: 2024-06-07
24/30479937 DC
BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
Formát
Dostupnost
Cena a měna
Anglicky Zabezpečené PDF
K okamžitému stažení
600 Kč
Anglicky Tisk
Skladem
600 Kč
| Označení normy: | 24/30479937 DC |
| Počet stran: | 49 |
| Vydáno: | 2024-06-07 |
| Status: | Draft for Comment |
Popis
24/30479937 DC
This standard 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope is classified in these ICS categories:
- 71.040.50 Physicochemical methods of analysis