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sklademVydáno: 2024-09-13
24/30500239 DC
BS EN IEC 62047-52 Semiconductor devices. Micro-electromechanical devices Part 52. Biaxial tensile testing method for stretchable MEMS
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| Označení normy: | 24/30500239 DC |
| Počet stran: | 15 |
| Vydáno: | 2024-09-13 |
| Status: | Draft for Comment |
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24/30500239 DC
This standard 24/30500239 DC BS EN IEC 62047-52 Semiconductor devices. Micro-electromechanical devices is classified in these ICS categories:
- 31.080.99 Other semiconductor devices