Hlavní stránka>24/30505492 DC BS EN IEC 62047-51 Semiconductor Devices - Micro-electromechanical Devices Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible microelectromechanical devices
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sklademVydáno: 2024-11-22
24/30505492 DC
BS EN IEC 62047-51 Semiconductor Devices - Micro-electromechanical Devices Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible microelectromechanical devices
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Označení normy:
24/30505492 DC
Počet stran:
20
Vydáno:
2024-11-22
Status:
Draft for Comment
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24/30505492 DC
This standard 24/30505492 DC BS EN IEC 62047-51 Semiconductor Devices - Micro-electromechanical Devices is classified in these ICS categories: