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Hlavní stránka>24/30505492 DC BS EN IEC 62047-51 Semiconductor Devices - Micro-electromechanical Devices Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible microelectromechanical devices
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sklademVydáno: 2024-11-22
24/30505492 DC BS EN IEC 62047-51 Semiconductor Devices - Micro-electromechanical Devices Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible microelectromechanical devices

24/30505492 DC

BS EN IEC 62047-51 Semiconductor Devices - Micro-electromechanical Devices Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible microelectromechanical devices

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Označení normy:24/30505492 DC
Počet stran:20
Vydáno:2024-11-22
Status:Draft for Comment
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24/30505492 DC


This standard 24/30505492 DC BS EN IEC 62047-51 Semiconductor Devices - Micro-electromechanical Devices is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices

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