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sklademVydáno: 2024-12-13
24/30506674 DC
BS EN IEC 63287-4 Semiconductor devices - Guidelines for reliability qualification plans Part 4: Early failure assessment
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| Označení normy: | 24/30506674 DC |
| Počet stran: | 16 |
| Vydáno: | 2024-12-13 |
| Status: | Draft for Comment |
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24/30506674 DC
This standard 24/30506674 DC BS EN IEC 63287-4 Semiconductor devices - Guidelines for reliability qualification plans is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general