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sklademVydáno: 2025-03-25
25/30513804 DC
Draft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers Part 1. Classification of defects
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| Označení normy: | 25/30513804 DC |
| Počet stran: | 30 |
| Vydáno: | 2025-03-25 |
| Status: | Draft for Comment |
| Alternativní označení: | Draft BS IEC 63581-1 Semiconductor devices |
Popis
25/30513804 DC
This standard 25/30513804 DC Draft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general