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Hlavní stránka>BS EN 60749-11:2002 Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
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sklademVydáno: 2003-10-24
BS EN 60749-11:2002 Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method

BS EN 60749-11:2002

Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method

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Označení normy:BS EN 60749-11:2002
Počet stran:12
Vydáno:2003-10-24
ISBN:0 580 40395 5
Status:Standard
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BS EN 60749-11:2002


This standard BS EN 60749-11:2002 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification. The contents of the corrigenda of January 2003 and August 2003 have been included in this copy.
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