This standard BS EN 60749-24:2004 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
31.080.01 Semiconductor devices in general
The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
