Cena s DPH / bez DPH
Hlavní stránka>BS EN 62047-15:2015 Semiconductor devices. Micro-electromechanical devices Test method of bonding strength between PDMS and glass
sklademVydáno: 2015-07-31
BS EN 62047-15:2015 Semiconductor devices. Micro-electromechanical devices Test method of bonding strength between PDMS and glass

BS EN 62047-15:2015

Semiconductor devices. Micro-electromechanical devices Test method of bonding strength between PDMS and glass

Formát
Dostupnost
Cena a měna
Anglicky Zabezpečené PDF
K okamžitému stažení
4500 Kč
Čtěte normu po dobu 1 hodiny. Více informací v kategorii E-READING
Čtení normy
na 1 hodinu
450.00 Kč
Čtěte normu po dobu 24 hodin. Více informací v kategorii E-READING
Čtení normy
na 24 hodin
1350.00 Kč
Anglicky Tisk
Skladem
4500 Kč
Označení normy:BS EN 62047-15:2015
Počet stran:18
Vydáno:2015-07-31
ISBN:978 0 580 70802 2
Status:Standard
Popis

BS EN 62047-15:2015


This standard BS EN 62047-15:2015 Semiconductor devices. Micro-electromechanical devices is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices

This part of IEC 62047 describes test method for bonding strength between poly dimethyl siloxane (PDMS) and glass. Silicone-based rubber, PDMS, is used for building of chip-based microfluidic devices fabricated using lithography and replica moulding processes. The problem of bonding strength is mainly for high pressure applications as in the case of certain peristaltic pump designs where an off chip compressed air supply is used to drive the fluids in micro channels created by a twin layer, one formed by bondage between glass with replica moulded PDMS and another between PDMS and PDMS. Also, in case of systems having pneumatic microvalves, a relatively high level of bonding particularly between two replica moulded layers of PDMS becomes quite necessary. Usually there is a leakage and debonding phenomena between interface of bonded areas, which causes unstability and shortage of lifetime for MEMS devices. This standard specifies general procedures on bonding test of PDMS and glass chip.