Přihlásit seRegistrovat se
Jazyk czen
Menu
KontaktOBCHODNÁPOVĚDAE-ReadingNovinky
Hledání
0
Celková cena
0 Kč
Cena s DPH / bez DPH
Hlavní stránka>BS EN 62047-17:2015 Semiconductor devices. Micro-electromechanical devices Bulge test method for measuring mechanical properties of thin films
Sponsored link
sklademVydáno: 2015-07-31
BS EN 62047-17:2015 Semiconductor devices. Micro-electromechanical devices Bulge test method for measuring mechanical properties of thin films

BS EN 62047-17:2015

Semiconductor devices. Micro-electromechanical devices Bulge test method for measuring mechanical properties of thin films

Formát
Dostupnost
Cena a měna
Anglicky Zabezpečené PDF
K okamžitému stažení
7564 Kč
Čtěte normu po dobu 1 hodiny. Více informací v kategorii E-READING
Čtení normy
na 1 hodinu
756.40 Kč
Čtěte normu po dobu 24 hodin. Více informací v kategorii E-READING
Čtení normy
na 24 hodin
2269.20 Kč
Anglicky Tisk
Skladem
7564 Kč
Označení normy:BS EN 62047-17:2015
Počet stran:34
Vydáno:2015-07-31
ISBN:978 0 580 72203 5
Status:Standard
Popis

BS EN 62047-17:2015


This standard BS EN 62047-17:2015 Semiconductor devices. Micro-electromechanical devices is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices
IEC 62047-17:2015 specifies the method for performing bulge tests on the free-standing film that is bulged within a window. The specimen is fabricated with micro/nano structural film materials, including metal, ceramic and polymer films, for MEMS, micromachines and others. The thickness of the film is in the range of 0,1 ? to 10 ?, and the width of the rectangular and square membrane window and the diameter of the circular membrane range from 0,5 mm to 4 mm. The tests are carried out at ambient temperature, by applying a uniformly-distributed pressure to the testing film specimen with bulging window. Elastic modulus and residual stress for the film materials can be determined with this method.
Tisk