Cena s DPH / bez DPH
Hlavní stránka>BS EN 62258-1:2010 Semiconductor die products Procurement and use
Sponsored link
sklademVydáno: 2010-11-30
BS EN 62258-1:2010 Semiconductor die products Procurement and use

BS EN 62258-1:2010

Semiconductor die products Procurement and use

Formát
Dostupnost
Cena a měna
Anglicky Zabezpečené PDF
K okamžitému stažení
8556 Kč
Čtěte normu po dobu 1 hodiny. Více informací v kategorii E-READING
Čtení normy
na 1 hodinu
855.60 Kč
Čtěte normu po dobu 24 hodin. Více informací v kategorii E-READING
Čtení normy
na 24 hodin
2566.80 Kč
Anglicky Tisk
Skladem
8556 Kč
Označení normy:BS EN 62258-1:2010
Počet stran:48
Vydáno:2010-11-30
ISBN:978 0 580 59110 5
Status:Standard
Popis

BS EN 62258-1:2010


This standard BS EN 62258-1:2010 Semiconductor die products is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices
IEC 62258-1:2009 has been developed to facilitate the production, supply and use of semiconductor die products, including:
- wafers,
- singulated bare die,
- die and wafers with attached connection structures,
- minimally or partially encapsulated die and wafers.
This standard defines the minimum requirements for the data that are needed to describe such die products and is intended as an aid to the design of and procurement for assemblies incorporating die products. It covers the requirements for data, including:
- product identity,
- product data,
- die mechanical information,
- test, quality, assembly and reliability information,
- handling, shipping and storage information.
The main changes that have been introduced in this edition have been to ensure consistency across all parts of the standard. The ordering of the subclauses, particularly in Clause 6, has been changed to be more logical and the text of some of the requirements has been amended to add requirements on further information as covered by IEC/TR 62258-4, IEC/TR 62258-7 and IEC/TR 62258-8. New requirements include information on permutability of terminals and functional elements (6.6.4) and moisture sensitivity for partially encapsulated devices (8.8).