Cena s DPH / bez DPH
Sponsored link
sklademVydáno: 2010-07-31
BS EN 62416:2010
Semiconductor devices. Hot carrier test on MOS transistors
Formát
Dostupnost
Cena a měna
Anglicky Zabezpečené PDF
K okamžitému stažení
3906 Kč
Anglicky Tisk
Skladem
3906 Kč
| Označení normy: | BS EN 62416:2010 |
| Počet stran: | 14 |
| Vydáno: | 2010-07-31 |
| ISBN: | 978 0 580 58621 7 |
| Status: | Standard |
Popis
BS EN 62416:2010
This standard BS EN 62416:2010 Semiconductor devices. Hot carrier test on MOS transistors is classified in these ICS categories:
- 31.080.30 Transistors
This standard describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.