BS EN IEC 60749-17:2019

This standard BS EN IEC 60749-17:2019 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:

• 31.080.01 Semiconductor devices in general

The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.

The objectives of the test are as follows:

1. to detect and measure the degradation of critical semiconductor device parameters as a function of neutron fluence, and

2. to determine if specified semiconductor device parameters are within specified limits after exposure to a specified level of neutron fluence (see Clause 6).