This standard BS EN IEC 63287-2:2023 Semiconductor devices. Guidelines for reliability qualification plans is classified in these ICS categories:
31.080.01 Semiconductor devices in general
31.080.99 Other semiconductor devices
This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
