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Hlavní stránka>BS EN IEC 63364-1:2022 Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
sklademVydáno: 2023-02-02
BS EN IEC 63364-1:2022 Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection

BS EN IEC 63364-1:2022

Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection

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Označení normy:BS EN IEC 63364-1:2022
Počet stran:18
Vydáno:2023-02-02
ISBN:978 0 539 16660 6
Status:Standard
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BS EN IEC 63364-1:2022


This standard BS EN IEC 63364-1:2022 Semiconductor devices. Semiconductor devices for IoT system is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
  • 31.080.99 Other semiconductor devices
This part of IEC 63364-1 provides terms, test method, and report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions. In addition, this document defines the configuration items and criteria of standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT.
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