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sklademVydáno: 2019-06-07
BS IEC 60747-18-1:2019
Semiconductor devices Semiconductor bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors
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| Označení normy: | BS IEC 60747-18-1:2019 |
| Počet stran: | 30 |
| Vydáno: | 2019-06-07 |
| ISBN: | 978 0 580 95779 6 |
| Status: | Standard |
Popis
BS IEC 60747-18-1:2019
This standard BS IEC 60747-18-1:2019 Semiconductor devices is classified in these ICS categories:
- 31.080.99 Other semiconductor devices
This part of IEC 60747 specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.