BS IEC 61445:2012

This standard BS IEC 61445:2012 Digital Test Interchange Format (DTIF) is classified in these ICS categories:

• 35.060 Languages used in information technology
• 25.040.01 Industrial automation systems in general

This standard defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:

1. UUT Model;

2. Stimulus and Response;

3. Fault Dictionary;

4. Probe.