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sklademVydáno: 2023-03-30
BS IEC 62373-1:2020
Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Fast BTI test for MOSFET
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| Označení normy: | BS IEC 62373-1:2020 |
| Počet stran: | 26 |
| Vydáno: | 2023-03-30 |
| ISBN: | 978 0 580 51373 2 |
| Status: | Standard |
Popis
BS IEC 62373-1:2020
This standard BS IEC 62373-1:2020 Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) is classified in these ICS categories:
- 31.080.30 Transistors
This document also defines the terms pertaining to the conventional BTI test method.