This standard BS IEC 62526:2007 Standard for extensions to standard test interface language (STIL) for semiconductor design environments is classified in these ICS categories:
25.040.01 Industrial automation systems in general
35.060 Languages used in information technology
Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.
