Hlavní stránka>BS IEC 62951-4:2019 Semiconductor devices. Flexible and stretchable semiconductor devices Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
Sponsored link
sklademVydáno: 2019-03-05
BS IEC 62951-4:2019
Semiconductor devices. Flexible and stretchable semiconductor devices Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
Formát
Dostupnost
Cena a měna
Anglicky Zabezpečené PDF
K okamžitému stažení
4898 Kč
Čtěte normu po dobu 1 hodiny. Více informací v kategorii E-READING
This standard BS IEC 62951-4:2019 Semiconductor devices. Flexible and stretchable semiconductor devices is classified in these ICS categories:
31.080.99 Other semiconductor devices
IEC 62951-4:2019 specifies an evaluation method of the bending fatigue properties of conductive thin film and flexible substrate for the application at flexible semiconductor devices. The films include any films deposited or bonded onto a non-conductive flexible substrate such as thin metal film, transparent conducting electrode, and thin silicon film used for flexible semiconductor devices. The electrical and mechanical behaviours of films on the substrate are evaluated. The fatigue test methods include dynamic bending fatigue test and static bending fatigue test.
