BS ISO 17470:2014

This standard BS ISO 17470:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry is classified in these ICS categories:

• 71.040.99 Other standards related to analytical chemistry

This International Standard gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm³ scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.