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sklademVydáno: 2018-05-31
BS ISO 17915:2018
Optics and photonics. Measurement method of semiconductor lasers for sensing
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| Označení normy: | BS ISO 17915:2018 |
| Počet stran: | 38 |
| Vydáno: | 2018-05-31 |
| ISBN: | 978 0 580 97243 0 |
| Status: | Standard |
Popis
BS ISO 17915:2018
This standard BS ISO 17915:2018 Optics and photonics. Measurement method of semiconductor lasers for sensing is classified in these ICS categories:
- 31.260 Optoelectronics. Laser equipment
This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.
This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.