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Hlavní stránka>BS ISO 18114:2021 Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials
sklademVydáno: 2021-05-18
BS ISO 18114:2021 Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials

BS ISO 18114:2021

Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials

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Označení normy:BS ISO 18114:2021
Počet stran:14
Vydáno:2021-05-18
ISBN:978 0 539 12680 8
Status:Standard
Popis

BS ISO 18114:2021


This standard BS ISO 18114:2021 Surface chemical analysis. Secondary-ion mass spectrometry. Determination of relative sensitivity factors from ion-implanted reference materials is classified in these ICS categories:
  • 71.040.40 Chemical analysis

This document specifies a method of determining relative sensitivity factors (RSFs) for secondary-ion mass spectrometry (SIMS) from ion-implanted reference materials.

The method is applicable to specimens in which the matrix is of uniform chemical composition, and in which the peak concentration of the implanted species does not exceed one atomic percent.


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