Cena s DPH / bez DPH
Sponsored link
sklademVydáno: 2015-11-30
BS ISO 19830:2015
Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
Formát
Dostupnost
Cena a měna
Anglicky Zabezpečené PDF
K okamžitému stažení
7998 Kč
Anglicky Tisk
Skladem
7998 Kč
Označení normy: | BS ISO 19830:2015 |
Počet stran: | 34 |
Vydáno: | 2015-11-30 |
ISBN: | 978 0 580 86519 0 |
Status: | Standard |
Popis
BS ISO 19830:2015
This standard BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy is classified in these ICS categories:
- 71.040.40 Chemical analysis
The purpose of this International Standard is to define how peak fitting and the results of peak fitting in X-ray photoelectron spectroscopy shall be reported. It is applicable to the fitting of a single spectrum or to a set of related spectra, as might be acquired, for example, during a depth profile measurement. This International Standard provides a list of those parameters which shall be reported if either reproducible peak fitting is to be achieved or a number of spectra are to be fitted and the fitted spectra compared. This International Standard does not provide instructions for peak fitting nor the procedures which should be adopted.