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sklademVydáno: 2024-11-19
BS ISO 20263:2024
Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
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| Označení normy: | BS ISO 20263:2024 |
| Počet stran: | 56 |
| Vydáno: | 2024-11-19 |
| ISBN: | 978 0 539 28489 8 |
| Status: | Standard |
Popis
BS ISO 20263:2024
This standard BS ISO 20263:2024 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials is classified in these ICS categories:
- 37.020 Optical equipment
- 71.040.50 Physicochemical methods of analysis