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sklademVydáno: 2024-11-21
BS ISO 20263:2024 - TC
Tracked Changes. Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
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Označení normy: | BS ISO 20263:2024 - TC |
Počet stran: | 145 |
Vydáno: | 2024-11-21 |
ISBN: | 978 0 539 34372 4 |
Status: | Tracked Changes |
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BS ISO 20263:2024 - TC
This standard BS ISO 20263:2024 - TC Tracked Changes. Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials is classified in these ICS categories:
- 37.020 Optical equipment
- 71.040.50 Physicochemical methods of analysis