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sklademVydáno: 2020-02-07
BS ISO 21222:2020
Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
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| Označení normy: | BS ISO 21222:2020 |
| Počet stran: | 26 |
| Vydáno: | 2020-02-07 |
| ISBN: | 978 0 580 96429 9 |
| Status: | Standard |
Popis
BS ISO 21222:2020
This standard BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method is classified in these ICS categories:
- 71.040.40 Chemical analysis
This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.