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sklademVydáno: 2020-02-27
BS ISO 25498:2018 - TC
Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
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Označení normy: | BS ISO 25498:2018 - TC |
Počet stran: | 116 |
Vydáno: | 2020-02-27 |
ISBN: | 978 0 539 11605 2 |
Status: | Tracked Changes |
Popis
BS ISO 25498:2018 - TC
This standard BS ISO 25498:2018 - TC Tracked Changes. Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope is classified in these ICS categories:
- 71.040.50 Physicochemical methods of analysis