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Hlavní stránka>BS ISO/IEC 29197:2015 Information technology. Evaluation methodology for environmental influence in biometric system performance
sklademVydáno: 2015-03-31
BS ISO/IEC 29197:2015 Information technology. Evaluation methodology for environmental influence in biometric system performance

BS ISO/IEC 29197:2015

Information technology. Evaluation methodology for environmental influence in biometric system performance

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Označení normy:BS ISO/IEC 29197:2015
Počet stran:34
Vydáno:2015-03-31
ISBN:978 0 580 76394 6
Status:Standard
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BS ISO/IEC 29197:2015


This standard BS ISO/IEC 29197:2015 Information technology. Evaluation methodology for environmental influence in biometric system performance is classified in these ICS categories:
  • 35.240.15 Identification cards and related devices
  • 35.020 Information technology (IT) in general

This International Standard addresses

  • fundamental requirements for planning and execution of environmental performance evaluations for biometric systems based on scenario and operational test methodologies,

  • specifications to define, establish, and measure specific conditions to assess, including requirements for equipment,

  • requirements for establishing a baseline performance in order to compare the influence of environmental parameters,

  • a specification of the biometric evaluation including requirements for test population, test protocols, data to record, and test results, and

  • procedures for carrying out the overall evaluation.

This International Standard does not

  • determine which parameters should be analysed for a specific biometric modality (This is currently covered in ISO/IEC/TR 19795-3.),

  • specify requirements to perform a vulnerability analysis modifying environmental factors (This is covered by ISO/IEC 19792.),

  • classify biometric systems upon performance against different environmental conditions, or

  • specify requirements for determining the functional effects of environmental conditions on hardware components (such as corrosion, electrical interference, breakage, etc.) of biometric systems.