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Hlavní stránka>DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
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sklademVydáno: 2011-07-31
DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

DD ISO/TS 10798:2011

Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

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Označení normy:DD ISO/TS 10798:2011
Počet stran:38
Vydáno:2011-07-31
ISBN:978 0 580 61380 7
Status:Standard
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DD ISO/TS 10798:2011


This standard DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis is classified in these ICS categories:
  • 07.120 Nanotechnologies

This Technical Specification establishes methods to characterize the morphology, and to identify the elemental composition of, catalysts and other inorganic impurities in raw and purified single-wall carbon nanotube (SWCNT) powders and films, using scanning electron microscopy and energy dispersive X-ray spectrometry analysis.

The methods described here for SWCNTs can also be applied to the analysis of multiwall carbon nanotubes (MWCNTs).


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