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sklademVydáno: 2017-11-30
17/30366375 DC
BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
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| Označení normy: | 17/30366375 DC |
| Počet stran: | 16 |
| Vydáno: | 2017-11-30 |
| Status: | Draft for Comment |
DESCRIPTION
17/30366375 DC
This standard 17/30366375 DC BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) is classified in these ICS categories:
- 31.080.30 Transistors