Homepage>18/30381548 DC BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
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sklademVydáno: 2018-08-03
18/30381548 DC
BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
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Označení normy:
18/30381548 DC
Počet stran:
17
Vydáno:
2018-08-03
Status:
Draft for Comment
DESCRIPTION
18/30381548 DC
This standard 18/30381548 DC BS EN 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) is classified in these ICS categories:
