Log inSign up
LANGUAGE czen
Menu
ContactSTOREFAQE-ReadingNews
SEARCH
0
Total price
0 €
PRICES include / exclude VAT
Homepage>18/30383935 DC BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
Sponsored link
sklademVydáno: 2018-12-04
18/30383935 DC BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application

18/30383935 DC

BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application

Format
Availability
Price and currency
Anglicky Secure PDF
Immediate download
24.45 €
Anglicky Hardcopy
In stock
24.45 €
Označení normy:18/30383935 DC
Počet stran:19
Vydáno:2018-12-04
Status:Draft for Comment
DESCRIPTION

18/30383935 DC


This standard 18/30383935 DC BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
  • 31.080.99 Other semiconductor devices
  • 31.140 Piezoelectric devices

Print