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sklademVydáno: 2021-04-01
21/30394409 DC
BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
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| Označení normy: | 21/30394409 DC |
| Počet stran: | 18 |
| Vydáno: | 2021-04-01 |
| Status: | Draft for Comment |
DESCRIPTION
21/30394409 DC
This standard 21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method is classified in these ICS categories:
- 25.220.40 Metallic coatings
- 17.040.20 Properties of surfaces
This document specifies a destructive method for the measurement of the local thickness of metallic coatings (hereafter also other inorganic coatings are meant) by examination of cross-sections with a scanning electron microscope (SEM). The method can be used for thicknesses up to several millimetres, but for such thick coatings it is usually more practical to use a light microscope (ISO 1463) when applicable. The lower thickness limit depends on the achieved measurement uncertainty (see Clause 10).