Log inSign up
LANGUAGE czen
Menu
ContactSTOREFAQE-ReadingNews
SEARCH
0
Total price
0 €
PRICES include / exclude VAT
Homepage>24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
Sponsored link
sklademVydáno: 2024-06-07
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope

24/30479937 DC

BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope

Format
Availability
Price and currency
Anglicky Secure PDF
Immediate download
24.68 €
Anglicky Hardcopy
In stock
24.68 €
Označení normy:24/30479937 DC
Počet stran:49
Vydáno:2024-06-07
Status:Draft for Comment
DESCRIPTION

24/30479937 DC


This standard 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope is classified in these ICS categories:
  • 71.040.50 Physicochemical methods of analysis

Print