Homepage>24/30486622 DC BS EN IEC 62047-49. Semiconductor devices. Micro-electromechanical devices Part 49. Reliability test methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever
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24/30486622 DC
BS EN IEC 62047-49. Semiconductor devices. Micro-electromechanical devices Part 49. Reliability test methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever
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Označení normy:
24/30486622 DC
Počet stran:
11
Vydáno:
2024-02-01
Status:
Draft for Comment
DESCRIPTION
24/30486622 DC
This standard 24/30486622 DC BS EN IEC 62047-49. Semiconductor devices. Micro-electromechanical devices is classified in these ICS categories:
