Log inSign up
LANGUAGE czen
Menu
ContactSTOREFAQE-ReadingNews
SEARCH
0
Total price
0 €
PRICES include / exclude VAT
Homepage>24/30499009 DC BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects
Sponsored link
sklademVydáno: 2024-08-16
24/30499009 DC BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects

24/30499009 DC

BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects

Format
Availability
Price and currency
Anglicky Secure PDF
Immediate download
24.51 €
Anglicky Hardcopy
In stock
24.51 €
Označení normy:24/30499009 DC
Počet stran:31
Vydáno:2024-08-16
Status:Draft for Comment
DESCRIPTION

24/30499009 DC


This standard 24/30499009 DC BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices

Print