Homepage>24/30499009 DC BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects
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24/30499009 DC
BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification of defects
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Označení normy:
24/30499009 DC
Počet stran:
31
Vydáno:
2024-08-16
Status:
Draft for Comment
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24/30499009 DC
This standard 24/30499009 DC BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers is classified in these ICS categories:
