Homepage>24/30500239 DC BS EN IEC 62047-52 Semiconductor devices. Micro-electromechanical devices Part 52. Biaxial tensile testing method for stretchable MEMS
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24/30500239 DC
BS EN IEC 62047-52 Semiconductor devices. Micro-electromechanical devices Part 52. Biaxial tensile testing method for stretchable MEMS
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Označení normy:
24/30500239 DC
Počet stran:
15
Vydáno:
2024-09-13
Status:
Draft for Comment
DESCRIPTION
24/30500239 DC
This standard 24/30500239 DC BS EN IEC 62047-52 Semiconductor devices. Micro-electromechanical devices is classified in these ICS categories:
