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Homepage>24/30501951 DC BS EN IEC 60749-26 Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
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sklademVydáno: 2024-11-29
24/30501951 DC BS EN IEC 60749-26 Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

24/30501951 DC

BS EN IEC 60749-26 Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

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Označení normy:24/30501951 DC
Počet stran:53
Vydáno:2024-11-29
Status:Draft for Comment
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24/30501951 DC


This standard 24/30501951 DC BS EN IEC 60749-26 Semiconductor devices - Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

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