Homepage>24/30501951 DC BS EN IEC 60749-26 Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
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24/30501951 DC
BS EN IEC 60749-26 Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
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24/30501951 DC
Počet stran:
53
Vydáno:
2024-11-29
Status:
Draft for Comment
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24/30501951 DC
This standard 24/30501951 DC BS EN IEC 60749-26 Semiconductor devices - Mechanical and climatic test methods is classified in these ICS categories: