PRICES include / exclude VAT

Homepage>BS EN 60749-1:2003 Semiconductor devices. Mechanical and climatic test methods General

BS EN 60749-1:2003

Semiconductor devices. Mechanical and climatic test methods General

Anglicky Secure PDF

Immediate download

154.05 €

You can read the standard for 1 hour. More information in the category: E-reading

Reading the standard

for 1 hour

15.41 €

You can read the standard for 24 hours. More information in the category: E-reading

Reading the standard

for 24 hours

46.22 €

Anglicky Hardcopy

In stock

154.05 €

Označení normy:	BS EN 60749-1:2003
Počet stran:	12
Vydáno:	2003-07-07
ISBN:	0 580 42198 8
Status:	Standard

DESCRIPTION

BS EN 60749-1:2003

This standard BS EN 60749-1:2003 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:

31.080.01 Semiconductor devices in general

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.

Print RECOMMEND