PRICES include / exclude VAT

Homepage>BS EN 60749-11:2002 Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method

BS EN 60749-11:2002

Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method

Anglicky Secure PDF

Immediate download

154.05 €

You can read the standard for 1 hour. More information in the category: E-reading

Reading the standard

for 1 hour

15.41 €

You can read the standard for 24 hours. More information in the category: E-reading

Reading the standard

for 24 hours

46.22 €

Anglicky Hardcopy

In stock

154.05 €

Označení normy:	BS EN 60749-11:2002
Počet stran:	12
Vydáno:	2003-10-24
ISBN:	0 580 40395 5
Status:	Standard

DESCRIPTION

BS EN 60749-11:2002

This standard BS EN 60749-11:2002 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:

31.080.01 Semiconductor devices in general

Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification. The contents of the corrigenda of January 2003 and August 2003 have been included in this copy.

Print RECOMMEND