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Homepage>BS EN 60749-16:2003 Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)

sklademVydáno: 2004-06-24

BS EN 60749-16:2003

Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)

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Označení normy:	BS EN 60749-16:2003
Počet stran:	10
Vydáno:	2004-06-24
ISBN:	0 580 42062 0
Status:	Standard

DESCRIPTION

BS EN 60749-16:2003

This standard BS EN 60749-16:2003 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:

31.080.01 Semiconductor devices in general

Defines a test aiming at detecting the presence of loose particles inside a cavity device such as, for example, chips of ceramic, pieces of bonding wire or solder balls (prills).

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