PRICES include / exclude VAT
Sponsored link
sklademVydáno: 2017-11-24
BS EN 60749-3:2017
Semiconductor devices. Mechanical and climatic test methods External visual examination
Format
Availability
Price and currency
Anglicky Secure PDF
Immediate download
194.33 €
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
19.43 €
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
58.30 €
Anglicky Hardcopy
In stock
194.33 €
| Označení normy: | BS EN 60749-3:2017 |
| Počet stran: | 18 |
| Vydáno: | 2017-11-24 |
| ISBN: | 978 0 580 94893 0 |
| Status: | Standard |
DESCRIPTION
BS EN 60749-3:2017
This standard BS EN 60749-3:2017 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general
The purpose of this part of IEC 60749 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The test is useful for qualification, process monitor, or lot acceptance.