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Homepage>BS EN 60749-32:2003+A1:2010 Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (externally induced)

BS EN 60749-32:2003+A1:2010

Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (externally induced)

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Označení normy:	BS EN 60749-32:2003+A1:2010
Počet stran:	8
Vydáno:	2011-03-31
ISBN:	978 0 580 68754 9
Status:	Standard

DESCRIPTION

BS EN 60749-32:2003+A1:2010

This standard BS EN 60749-32:2003+A1:2010 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:

31.080.01 Semiconductor devices in general

This part of IEC 60749 is applicable to semiconductor devices (discrete devices and integrated circuits).

The object of this test is to determine whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device.

NOTE This test is identical to the test method contained in 1.2 of chapter 4 of IEC 60749 (1996), apart from the addition of this clause, the addition of titles to clauses 2 and 3 and renumbering.

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