Log inSign up
LANGUAGE czen
Menu
ContactSTOREFAQE-ReadingNews
SEARCH
0
Total price
0 €
PRICES include / exclude VAT
Homepage>BS EN 60749-35:2006 Semiconductor devices. Mechanical and climatic test methods Acoustic microscopy for plastic encapsulated electronic components
Sponsored link
sklademVydáno: 2006-11-30
BS EN 60749-35:2006 Semiconductor devices. Mechanical and climatic test methods Acoustic microscopy for plastic encapsulated electronic components

BS EN 60749-35:2006

Semiconductor devices. Mechanical and climatic test methods Acoustic microscopy for plastic encapsulated electronic components

Format
Availability
Price and currency
Anglicky Secure PDF
Immediate download
263.89 €
Anglicky Hardcopy
In stock
263.89 €
Označení normy:BS EN 60749-35:2006
Počet stran:24
Vydáno:2006-11-30
ISBN:0 580 49739 9
Status:Standard
DESCRIPTION

BS EN 60749-35:2006


This standard BS EN 60749-35:2006 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
Defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components. Provides a guide to the use of acoustic microscopy for detecting anomalies (delamination, cracks, mould-compound voids, etc.) reproducibly and non-destructively in plastic packages.
Print