Menu
0
Total price
0 €
PRICES include / exclude VAT
Homepage>BS EN 60749-36:2003 Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state
Sponsored link
sklademVydáno: 2003-06-19
BS EN 60749-36:2003 Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state

BS EN 60749-36:2003

Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state

Format
Availability
Price and currency
Anglicky Secure PDF
Immediate download
154.05 €
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standard
for 1 hour
15.41 €
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standard
for 24 hours
46.22 €
Anglicky Hardcopy
In stock
154.05 €
Označení normy:BS EN 60749-36:2003
Počet stran:8
Vydáno:2003-06-19
ISBN:0 580 42065 5
Status:Standard
DESCRIPTION

BS EN 60749-36:2003


This standard BS EN 60749-36:2003 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.