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Homepage>BS EN 60749-4:2017 Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)

sklademVydáno: 2017-11-28

BS EN 60749-4:2017

Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)

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Označení normy:	BS EN 60749-4:2017
Počet stran:	16
Vydáno:	2017-11-28
ISBN:	978 0 580 94229 7
Status:	Standard

DESCRIPTION

BS EN 60749-4:2017

This standard BS EN 60749-4:2017 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:

31.080.01 Semiconductor devices in general

This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

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