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Homepage>BS EN 61967-6:2002+A1:2008 Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. Magnetic probe method

BS EN 61967-6:2002+A1:2008

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. Magnetic probe method

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Označení normy:	BS EN 61967-6:2002+A1:2008
Počet stran:	46
Vydáno:	2010-12-31
ISBN:	978 0 580 72986 7
Status:	Standard

DESCRIPTION

BS EN 61967-6:2002+A1:2008

This standard BS EN 61967-6:2002+A1:2008 Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz is classified in these ICS categories:

31.200 Integrated circuits. Microelectronics

This part of the IEC 61967 specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz. This method is applicable to the measurement of a single IC or a chip set of ICs on the standardized test board for characterization and comparison purposes. It is also usable to evaluate the electromagnetic characteristics of an IC or group of ICs on an actual application PCB for emission reduction purposes. This method is called the "magnetic probe method".

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