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Homepage>BS EN 62373:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

BS EN 62373:2006

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

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Označení normy:	BS EN 62373:2006
Počet stran:	16
Vydáno:	2006-09-29
ISBN:	0 580 49255 9
Status:	Standard

DESCRIPTION

BS EN 62373:2006

This standard BS EN 62373:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) is classified in these ICS categories:

31.080.30 Transistors

Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)

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